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HomeKey Engineering MaterialsKey Engineering Materials Vol. 248Effect of Oxygen Source and Buffer Layer on...

Effect of Oxygen Source and Buffer Layer on Crystal Structure and Electric Properties of ZnO Films Grown by Pulsed Laser Deposition

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Electroceramics in Japan VI

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Periodical:

Key Engineering Materials (Volume 248)

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83-86

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.248.83

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Online since:

August 2003

Authors:

Yutaka Adachi, Isao Sakaguchi, Haruki Ryouken, Naoki Ohashi, Hajime Haneda, Tadashi Takenaka

Keywords:

Atomic Force Microscope (AFM), Hall Measurement, Nitrogen Dioxide, Pulsed Laser Deposition (PLD), Zinc Oxide (ZnO)

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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