Synthesis and Properties of Nd-Substituted Bismuth Titanate Polycrystalline Thin Films with Polar-Axis Orientation

Masahiro  Kurachi; Hirofumi Matsuda; Takashi Iijima; Hiroshi Uchida; Seiichiro Koda; Takayuki Watanabe; Hiroshi Funakubo

doi:10.4028/www.scientific.net/KEM.269.53

Paper Titles

Low Temperature Sintering of (Pb_0.92Sr_0.06)(Zr_0.52Ti_0.46Nb_0.02)O₃ Ceramics
p.35

Polarization Switching in CaBi₄Ti₄O₁₅ Ferroelectric Thin Films
p.41

Giant Ferroelectric Polarization in Polar-Axis-Oriented Bi_4-xPr_xTi₃O₁₂ Polycrystalline Thin Films
p.45

Construction of MFIS Structure Using Alkoxy-Derived (Y,Yb)MnO₃ Thin Films
p.49

Synthesis and Properties of Nd-Substituted Bismuth Titanate Polycrystalline Thin Films with Polar-Axis Orientation
p.53

Composition Dependence of Lead-Free Ferroelectric Ba(Ti,Zr)O₃ Thin Films Fabricated by Chemical Solution Deposition Process
p.57

Preparation and Characterization of Lead Zirconate Titanate Thin Films on Si Substrate by Metal-Organic Chemical Vapor Deposition
p.61

Optical Properties of PLZT Thin Films Fabricated by a Sol-Gel Method
p.65

Influence of SRO Top Electrode on Fatigue Characteristics of FRAM
p.69

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Synthesis and Properties of Nd-Substituted Bismuth Titanate Polycrystalline Thin Films with Polar-Axis Orientation

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Key Engineering Materials (Volume 269)

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53-56

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.269.53

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Online since:

August 2004

Authors:

Masahiro Kurachi, Hirofumi Matsuda, Takashi Iijima, Hiroshi Uchida, Seiichiro Koda, Takayuki Watanabe, Hiroshi Funakubo

Keywords:

Bismuth Layer Structured Ferroelectrics, Chemical Solution Deposition CSD, Lanthanoid, Orientation Control, Poly-Crystalline Film

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