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HomeKey Engineering MaterialsKey Engineering Materials Vol. 269Optical Properties of PLZT Thin Films Fabricated...

Optical Properties of PLZT Thin Films Fabricated by a Sol-Gel Method

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Electroceramics in Japan VII

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Periodical:

Key Engineering Materials (Volume 269)

Pages:

65-68

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.269.65

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Online since:

August 2004

Authors:

Masatoshi Ishii, Keisuke Satoh, Masayuki Kato, Kazuaki Kurihara

Keywords:

Birefringence, Electro-Optic Coefficient, Epitaxial, PLZT, Refractive Index, Sol-Gel Method, Thin Film

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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[8] C. J. Brinker and G. W. Scherer, Sol-gel science, Academic press, 1990. Author to whom correspondence should be addressed; e-mail: ishii. masatoshi@jp. fujitsu. com Fax: +81-46-248-6000, http: /www. labs. fujitsu. com/ Fig. 9. EO coefficient as a function of PLZT composition.

[5] [10] [15] [20] [25] [30] [35] [40] [45] [50] 0 5 10 La (Atom% ) EO coefficient (pm/V) . TE TM Fig. 8. Refractive index changes of PLZT thin films. -5 -4 -3 -2 -1.

0 10 20 Electric field (MV/m) Refractive index change . 0/52/48 9/65/35 10/65/35 ×10 -3 TM mode.