Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy

Abstract:

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Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3 (x = 0.75, 0.8, 0.9, 1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperaturedependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric – paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.

Info:

Periodical:

Key Engineering Materials (Volumes 280-283)

Edited by:

Wei Pan, Jianghong Gong, Chang-Chun Ge and Jing-Feng Li

Pages:

1903-1908

DOI:

10.4028/www.scientific.net/KEM.280-283.1903

Citation:

S. G. Lu et al., "Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy", Key Engineering Materials, Vols. 280-283, pp. 1903-1908, 2005

Online since:

February 2007

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$35.00

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