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HomeKey Engineering MaterialsKey Engineering Materials Vols. 280-283Preparation and Characterization of...

Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy

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Abstract:

Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3 (x = 0.75, 0.8, 0.9, 1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperaturedependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric – paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.

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Periodical:

Key Engineering Materials (Volumes 280-283)

Pages:

1903-1908

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.280-283.1903

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Online since:

February 2007

Authors:

Sheng Guo Lu, Haydn Chen, C.L. Mak, K.H. Wong, H.W.L. Chan, C.L. Choy, Jian Jun Xu, Shao Qiu Shi

Keywords:

Barium Strontium Titanate, Scanning Force Microscopy, Thin Film

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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