Characterisation of Surface Properties by a Multi-Function TPM

Xian Ping Liu; J. Zhang

doi:10.4028/www.scientific.net/KEM.295-296.9

Paper Titles

Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer
p.3

Characterisation of Surface Properties by a Multi-Function TPM
p.9

Development of an Evanescent Light Measurement System for Si Wafer Microdefect Detection
p.15

An Embedded FBG Sensor for Dynamic Strain Measurement for a Clamped-Clamped Composite Structure
p.21

A Thermovision Method for Studying Deformation Kinetics of Materials and Structure Elements
p.27

Damage Detection of Composite Structures Using Dynamic Analysis
p.33

Investigation of Nonisothermal Crystallization Behaviors of Poly and Silica Nanocomposites Using Differential Scanning Calorimetry
p.39

Ellipsometric Detection of Transitional Surface Structures on Decapped GaAs(001)
p.45

Temperature Effect on the Stability of CuO Nanofluids Based on Measured Particle Distribution
p.51

HomeKey Engineering MaterialsKey Engineering Materials Vols. 295-296Characterisation of Surface Properties by a...

Characterisation of Surface Properties by a Multi-Function TPM

Abstract:

A novel measurement system, the multi-functional Tribological Probe Microscope (TPM), has been developed to provide multi-function measurements of surface and surface properties. These properties are topography, friction, Young’s modulus, and nano-hardness. They are measured, point-by-point, in a single scan set up. The four function maps of surface topography, friction, hardness and Young’s modulus are correlated in space and time. In this paper we will brief the TPM system and demonstrate the capability of the multi-function evaluation of engineering surfaces and their correlated nature between these functions. It is believed that such direct correlated measurements will help scientist and engineers to understand surface and surface related properties and eventually to design and optimise a surface for a better performance.

You might also be interested in these eBooks

Measurement Technology and Intelligent Instruments VI

View Preview

Info:

Periodical:

Key Engineering Materials (Volumes 295-296)

Pages:

9-14

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.295-296.9

Citation:

Cite this paper

Online since:

October 2005

Authors:

Xian Ping Liu, J. Zhang

Keywords:

Friction, Measurement of Surface Properties, Nano Hardness, Nanotribology, Scanning Probe Microscope, Surface Characterisation

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] M. Heuberger, G. Dietler and L. Schlabach: Nanotechnology, Vol. 5 (1994), p.12.

Google Scholar

[2] R.M. Overney, T. Bonner, E. Meyer, M. Reutschi, R. Luthi, L. Howald, J. Frommer, H.J. Guntherodt, M. Fujihara and H. Takano: J. Vac. Sci. Technol. B, Vol. 12 (1994), p. (1973).

Google Scholar

[3] F. Gao and X. Liu: 1 st Euspen Topical Conference on Fabrication and Metrology in Nanotechnology, Demark, Vol. 1 (2000), p.52.

Google Scholar

[4] X. Liu: Proceedings of the Royal Microscopical Society, Vol. 37 (2002), p.215.

Google Scholar

[5] X. Liu, T. Bell, D.G. Chetwynd and X.Y. Li: Wear, 2003, in print.

Google Scholar

[6] X. Liu: Nanotribological Probe Microscope, WO99/45361, (1999).

Google Scholar

[7] W.C. Oliver and G.M. Pharr: J. Mater. Res., Vol. 7 (1992), p.1564.

Google Scholar

[8] K. Herrmann, N.M. Jennett, W. Wegener, J. Meneve, K. Hasche and R. Seemann: Thin Solid Films, Vol. 377-378 (2000), p.394.

DOI: 10.1016/s0040-6090(00)01367-5

Google Scholar