Analyzed by Kelvin Force Microscopy of PbZr0.3Ti0.7O3 Thin Films Grown on La0.5Sr0.5CoO3 or LaMnO3 Bottom Electrodes
We have investigated structural and electrical properties of PbZr0.3Ti0.7O3 (PZT) thin films deposited by pulsed laser deposition methods. In order to improve the ferroelectric properties of PZT thin films, we have controlled grain size or surface morphology by changing bottom electrode or deposition time. PZT thin films have been deposited on La0.5Sr0.5CoO3 (LSCO) or LaMnO3 (LMO) bottom electrodes with LaAlO3 substrates during different deposition times. X-ray diffraction data have shown that all the PZT films and bottom electrodes are highly oriented with their c-axes normal to the substrates. The thickness of each film is determined by field-emission scanning electron microscope. We have also observed alternation of grain sizes (80~180 nm) by using atomic force microscopy mode and surface potential distribution and retention behavior of ferroelectric domains by using Kelvin force microscopy mode. A PZT/LMO structure has shown superior ferroelectric and retention properties to a PZT/LSCO structure.
Ichsan Setya Putra and Djoko Suharto
J.S. Choi et al., "Analyzed by Kelvin Force Microscopy of PbZr0.3Ti0.7O3 Thin Films Grown on La0.5Sr0.5CoO3 or LaMnO3 Bottom Electrodes", Key Engineering Materials, Vols. 306-308, pp. 1295-1300, 2006