Indentation Size Effect on Hardness of Nanostructured Thin Films

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Based on nanoindentation techniques, the evaluation of hardness of two nanostructured thin films, AlN and Ti-Al-N, is discussed. In the case of AlN films, the indentation size effect of hardness can be modeled using the concept of geometrically necessary dislocations, whereas in the case of Ti-Al-N films, the measured hardness increases exponentially as the indentation depth decreases. The results show that, as thin films approach superhard, dislocation-based plastic deformation is gradually replaced by grain-boundary mediated deformation.

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363-368

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June 2006

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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