Experimental and Theoretical Investigation of Viscoplastic Deformation of Solder Alloys for Electronic Packaging

Takuji Kobayashi; Katsuhiko Sasakir; Ken-Ichi Ohguchi; Yoshihiro Narita

doi:10.4028/www.scientific.net/KEM.345-346.97

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 345-346Experimental and Theoretical Investigation of...

Experimental and Theoretical Investigation of Viscoplastic Deformation of Solder Alloys for Electronic Packaging

Abstract:

This paper discusses ratchetting deformation of lead-free solder Sn/3Ag/0.5Cu and lead-containing solder alloy Sn/37Pb with several stress amplitudes and stress ratios of the maximum stress to the minimum stress. First the uniaxial ratchetting testsare conducted with three maximum stresses and five stress ratios. The all tests are conducted using cylindrical bulk specimens of the solder alloys at 313 K. The test results show that there is the difference in the viscoplastic deformation behavior between two solder alloys. The relationship between ratchetting strain and time is estimated by Biley-Norton law to explain that the uniaxial ratchetting deformation is strongly dominated by the viscous deformation. Finally, the ratchetting deformation is simulated by the dislocation based constitutive model proposed by Estrin [1]. The simulations show that there is a possibility to simulate the uniaxial ratchetting by clarifying the dislocation mechanism of the solder alloys.

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Periodical:

Key Engineering Materials (Volumes 345-346)

Pages:

97-100

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.345-346.97

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Online since:

August 2007

Authors:

Takuji Kobayashi, Katsuhiko Sasakir, Ken-Ichi Ohguchi, Yoshihiro Narita

Keywords:

Constitutive Modeling, Creep, Dislocation, Electronic Packaging, Lead-Free Solder, Plasticity, Ratcheting

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References

[1] Y. Estrin, H. Braasch, and Y. Brechet: Mater. J. Eng. Mat. Tech. Vol. 118(1996), p.441.

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[2] K. Ohguchi, K. Sasaki, and M. Ishibashi: J. Elec. Mat. 35(2006) p.132.

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[3] K. Sasaki, T. Kobayashi, and K, Ohguchi: J. Elec. Pack. in press.

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[4] X.J. Yang, C.L. Chow, K.J. Lau: International Journal of Fatigue 25 (2003) p.533 � 0.

05.

150 10 20 30 40 50.

25 -0. 5 -1.

25 -0. 5 -1 Ratchetting strain [%] Cycle number Experiment Stress ratio Simulation � � � � �� 0.

05.

150 10 20 30 40 50.

25 -0. 5 -1.

25 -0. 5 -1 Ratchetting strain [%] Cycle number Experiment Stress ratio Simulation (a) lead-containing solder (b) lead-free solder Fig. 6. The experiment and simulation results with constitutive model of maximum stress 15 MPa Table 3. Material constants (a) lead-containing solder (b) lead-free solder A A1 A2 A3 A4 A5 A6 m n ξ 0 v ε& 0σ E [GPa] 0 36 1 10354 83 36 0 4 56 1 1 98 35. 7 � A A1 A2 A3 A4 A5 A6 m n ξ 0 v ε& 0σ E [GPa] 0 406 1 10285 40 406 0 5. 9 58 1 1 52 44. 2.

DOI: 10.31030/3065729

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