Change of Microwave Dielectric Loss during the Solid-Reaction Synthesis of SrFeCo0.5Oy

Abstract:

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Rectangular cavity perturbation method was used to measure microwave dielectric loss (MDL) during the solid state reaction synthesis of SrFeCo0.5Oy. In the process of solid state reaction, the dielectric loss is investigated under different temperatures. The phases of the samples synthesized at different temperatures were characterized by XRD. The variation of MDL with temperature illustrates that the phase transformation occurs. The reasons why the pure perovskite phase can be obtained by using microwave processing were also discussed.

Info:

Periodical:

Key Engineering Materials (Volumes 368-372)

Edited by:

Wei Pan and Jianghong Gong

Pages:

183-184

DOI:

10.4028/www.scientific.net/KEM.368-372.183

Citation:

Z. J. Xu et al., "Change of Microwave Dielectric Loss during the Solid-Reaction Synthesis of SrFeCo0.5Oy", Key Engineering Materials, Vols. 368-372, pp. 183-184, 2008

Online since:

February 2008

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Price:

$35.00

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