Structure and Microwave Properties of NaxCa1-xAl2-xSi2+xO8 (0 < x < 0.67) Plagioclase Feldspar
The plagioclase feldspar (NaxCa1-xAl2-xSi2+xO8, 0<x<0.67), has been synthesized under sub-solidus conditions using the solid-reaction technique. X-ray diffraction (XRD) was used to study the temperature dependency of the phase and structure transformations. Scanning electron microscopy (SEM) was performed to demonstrate the micro-structure of the sintered samples. The dielectric properties in microwave (MW) frequency region, including the dielectric constant, Qxf and the temperature coefficient were measured by the microwave network analyzer. The results revealed the value of Qxf decreases when 0≤x≤0.2, while increases when 0.2≤x≤0.67. The lowest value of Qxf was at x = 0.2.
Wei Pan and Jianghong Gong
W. Li et al., "Structure and Microwave Properties of NaxCa1-xAl2-xSi2+xO8 (0 < x < 0.67) Plagioclase Feldspar", Key Engineering Materials, Vols. 368-372, pp. 185-187, 2008