(Mg,Zn)O/ZnO Heterostructures Prepared by Pulsed Laser Deposition

Yutaka Adachi; Naoki Ohashi; Isao Sakaguchi; Takeo Osawa; Haruki Ryoken; Hideki Yoshikawa; Shigenori Ueda; Keisuke Kobayashi; Hajime Haneda

doi:10.4028/www.scientific.net/KEM.388.3

Paper Titles

Preface

(Mg,Zn)O/ZnO Heterostructures Prepared by Pulsed Laser Deposition
p.3

Effect of Annealing on Electrical Degradation Characteristics of ZnO Varistors
p.7

Study on Recovery of Electrical Degradation of ZnO Varistors
p.11

Electrical Degradation Caused by Electro-Static Discharge Pulse in ZnO-Based Multilayer Varistor
p.15

Photoluminescence from ZnO Thin Film Deposited on R-Plane Sapphire Substrate by RF Magnetron Sputtering
p.19

Impurity Contamination and Diffusion during Annealing in Implanted ZnO
p.23

Synthesis of Well-Aligned ZnO Nanowhisker Films Using Aqueous Solution for Use in Dye-Sensitized Sensor
p.27

High-Rate Charge-Discharge Performance of Composite Electrodes of FeOOH-Based Amorphous Particles and Carbon Powder
p.33

HomeKey Engineering MaterialsKey Engineering Materials Vol. 388(Mg,Zn)O/ZnO Heterostructures Prepared by Pulsed...

(Mg,Zn)O/ZnO Heterostructures Prepared by Pulsed Laser Deposition

Abstract:

(Mg,Zn)O films were grown on Zn- and O-face ZnO single crystal substrates by pulsed laser deposition. The surface morphologies of the films grown on the Zn- and O-face substrates were quite different, indicating that no domain inversion occurred in both films. The films showed markedly different features for valence band spectra obtained by hard X-ray photoemission spectroscopy. This suggests that the effect of film polarity should be considered in X-ray photoemission spectroscopy.