Effect of Potential Function on Molecular Dynamics Simulation of Copper Processing

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Abstract:

In nanometric cutting process, the actual material removal can take place at atomic level, which makes it difficult or impossible to observe the machining phenomena and measure the cutting parameters in experiments. However, it is crucial to investigate the cutting process in nanoscale. In this study, the molecular dynamics (MD) method is employed to model and simulate the process of cutting monocrystalline copper. The two-body Morse potential and the many-body EAM potential are used for the atoms interaction in the workpiece to study the effect of different potential function on the simulation results. It is found that there are no obvious differences in the chip formation between Morse and EAM potential, but the Morse potential results in higher potential energy and more chips generated in the cutting process.

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Key Engineering Materials (Volumes 407-408)

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368-371

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February 2009

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© 2009 Trans Tech Publications Ltd. All Rights Reserved

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[1] T. H. Fang and C. I. Weng: Nanotechnology, vol. 11 (2000), pp.148-151.

Google Scholar

[2] J. D. Kim and C. H. Moon: J. Material Process Technology, vol. 59(1996), pp.309-311.

Google Scholar

[3] X. S. Han, B. Lin, S. Y. Yu and S. X. Wang: J. material process technology, vol. 129(2002), pp.105-107.

Google Scholar

[4] M. B. Cai, X. P. Li and M. Rahman: Int. J. Machine Tools Manufacture, vol. 47(2007), pp.75-78.

Google Scholar

[5] K Maekawa and A. Itoh: Wear, vol. 188 (1995), pp.115-116.

Google Scholar

[6] R. Komanduri, N. Chandrasekaran and L.M. Raff: Wear, vol. 240(2000), pp.60-63.

Google Scholar

[7] Y. Lin and T. Inamura: JSME, Vol. 49 (2006), pp.70-74.

Google Scholar

[8] Q. X. Pei, C. Lu, F. Z. Fang and H. wu: Computational Material Science, Vol. 37 (2006), pp.434-437.

Google Scholar

[9] M. S. Daw, S. M. Foiles and M. I. Baskes: Mater. Sci., Vol. 9 (1993), pp.251-253.

Google Scholar

[10] F. Z. Fang, H. Wu, W. Zhou and X. T. Hu: J. Material Processing Technology, Vol. 184 (2007) pp.407-410.

Google Scholar

[11] J. D. Kim and C. H. Moon: J. Material Process Technology, Vol. 59 (1996).

Google Scholar