Magnetic Compton Profile Measurement of Thin Films

Hiroyuki Nishino; Ryutaro Yamaki; Masayoshi Itou; Yoshiharu Sakurai; Hiroshi Sakurai; Masahisa Ito

doi:10.4028/www.scientific.net/KEM.459.11

Paper Titles

Preface

Organizers

Spin and Orbital Magnetic Moment of Pd₃Co Evaluated by X-Ray Magnetic Diffraction Experiment
p.3

Spin Density Distribution of YTiO₃ Observed by X-Ray Magnetic Diffraction
p.7

Magnetic Compton Profile Measurement of Thin Films
p.11

Ferromagnetic Resonance Frequency of Single-Layer Magnetic Metal Films with Lattice Distortion
p.15

Effect of Annealing on Sub-Gap Absorption in Amorphous InGaZnO₄ Films
p.19

Improvement of Crystallization Rate in Post-Annealed Ge₂Sb₂Te₅ Films
p.23

Ionic Conductivity of Polycrystalline Li₂Ge_xSi_1-xO₃ (x = 0.0~1.0)
p.27

HomeKey Engineering MaterialsKey Engineering Materials Vol. 459Magnetic Compton Profile Measurement of Thin Films

Magnetic Compton Profile Measurement of Thin Films

Abstract:

We have measured magnetic Compton profile of Co/Pd thin films sputtered on a substrate for studying the electronic structure. For the first time, a silicon nitride substrate of 100 nm thickness we used in the magnetic Compton scattering experiment. We have improved vacuum tubes of the Compton beam-line BL08W of SPring-8, and have reduced greatly the background scattering for the Compton profile. We have succeeded in measuring magnetic Compton profile of Co (0.8 nm)/Pd (1.6 nm) 400 nm multilayer.

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Periodical:

Key Engineering Materials (Volume 459)

Pages:

11-14

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.459.11

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Online since:

December 2010

Authors:

Hiroyuki Nishino, Ryutaro Yamaki, Masayoshi Itou, Yoshiharu Sakurai, Hiroshi Sakurai, Masahisa Ito

Keywords:

Magnetic Compton Scattering, Magnetic Multilayer, Pd/Co, SiN Membrane Substrate, Thin Film

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