Magnetic Compton Profile Measurement of Thin Films

Abstract:

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We have measured magnetic Compton profile of Co/Pd thin films sputtered on a substrate for studying the electronic structure. For the first time, a silicon nitride substrate of 100 nm thickness we used in the magnetic Compton scattering experiment. We have improved vacuum tubes of the Compton beam-line BL08W of SPring-8, and have reduced greatly the background scattering for the Compton profile. We have succeeded in measuring magnetic Compton profile of Co (0.8 nm)/Pd (1.6 nm) 400 nm multilayer.

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Periodical:

Edited by:

Osamu Hanaizumi and Masafumi Unno

Pages:

11-14

DOI:

10.4028/www.scientific.net/KEM.459.11

Citation:

H. Nishino et al., "Magnetic Compton Profile Measurement of Thin Films", Key Engineering Materials, Vol. 459, pp. 11-14, 2011

Online since:

December 2010

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$35.00

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