The Failure Investigations on the Thin Film Interface under the Dynamic Loading
The film spallation, a typical film / substrate failure style, could be caused by many reasons. The strong impact on the film/substrate can also lead to this failure phenomenon. So the film spallation induced by the strong impact is explored in this paper. Here the strong impact comes from the laser-driven flyer loading. In the numerical simulating process, the Finite Element Method (FEM) and Johnson-Cook material constitutive model have been used, moreover, some ideal film spallation results were got, which are helpful for us to understand this failure phenomenon.
Long Chen, Yongkang Zhang, Aixing Feng, Zhenying Xu, Boquan Li and Han Shen
H. J. Wang et al., "The Failure Investigations on the Thin Film Interface under the Dynamic Loading", Key Engineering Materials, Vol. 464, pp. 542-547, 2011