The Failure Investigations on the Thin Film Interface under the Dynamic Loading

Abstract:

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The film spallation, a typical film / substrate failure style, could be caused by many reasons. The strong impact on the film/substrate can also lead to this failure phenomenon. So the film spallation induced by the strong impact is explored in this paper. Here the strong impact comes from the laser-driven flyer loading. In the numerical simulating process, the Finite Element Method (FEM) and Johnson-Cook material constitutive model have been used, moreover, some ideal film spallation results were got, which are helpful for us to understand this failure phenomenon.

Info:

Periodical:

Edited by:

Long Chen, Yongkang Zhang, Aixing Feng, Zhenying Xu, Boquan Li and Han Shen

Pages:

542-547

DOI:

10.4028/www.scientific.net/KEM.464.542

Citation:

H. J. Wang et al., "The Failure Investigations on the Thin Film Interface under the Dynamic Loading", Key Engineering Materials, Vol. 464, pp. 542-547, 2011

Online since:

January 2011

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Price:

$35.00

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