The Failure Investigations on the Thin Film Interface under the Dynamic Loading

He Jun Wang; Hui Xia Liu; Zong Bao Shen; Wei Li; Yuan Yuan Zheng; Xiao Wang

doi:10.4028/www.scientific.net/KEM.464.542

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HomeKey Engineering MaterialsKey Engineering Materials Vol. 464The Failure Investigations on the Thin Film...

The Failure Investigations on the Thin Film Interface under the Dynamic Loading

Abstract:

The film spallation, a typical film / substrate failure style, could be caused by many reasons. The strong impact on the film/substrate can also lead to this failure phenomenon. So the film spallation induced by the strong impact is explored in this paper. Here the strong impact comes from the laser-driven flyer loading. In the numerical simulating process, the Finite Element Method (FEM) and Johnson-Cook material constitutive model have been used, moreover, some ideal film spallation results were got, which are helpful for us to understand this failure phenomenon.

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Periodical:

Key Engineering Materials (Volume 464)

Pages:

542-547

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.464.542

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Online since:

January 2011

Authors:

He Jun Wang, Hui Xia Liu, Zong Bao Shen, Wei Li, Yuan Yuan Zheng, Xiao Wang

Keywords:

Failure, Film Spallation, Laser-Driven Flyer, Numerical Simulation

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