Properties of BiFeO₃ Thin Films Prepared with Self-Assembled Monolayers by Liquid Phase Deposition

Abstract:

Using iron nitrate, bismuth nitrate, citric acid and glacial acetic acid as the raw materials, the BiFeO₃ thin films in crystalline state were prepared on FTO substrate with the self-assembled monolayers by liquid phase deposition after graded induction and annealing at 550°C for 30min. The physical phase composition, the surface morphology and dielectric properties of the thin films were characterized respectively by XRD, SEM, and Precision LCR Meter. This paper studied that the deposition temperature and the number of film layers had the effects on the thin films. The results show that the as-prepared thin films show the random orientation and good crystalline. When the deposition temperature is 70°C, the surface of the as-prepared thin film is smooth and uniform. The size of grain is 100nm. The thin film has a dense structure without the apparent pore phase. When the test frequency is between 1kHz and 1MHz, the loss of the thin films is decreased as the increase of the number of the film layers. When the number of the layers is 15, the dielectric constant of the thin films is 44 and the loss is 0.02 when the test frequency is 10kHz.

• Periodical: Key Engineering Materials (Volumes 512-515)
• Pages: 1244-1248
• DOI: https://doi.org/10.4028/www.scientific.net/KEM.512-515.1244
• Online since: June 2012
• Authors: Jun Yin, G.Q. Tan, Li Hua Song, Ao Xia, Hui Jun Ren
• Keywords: BiFeO₃ Thin Film, Dielectric Property, Self-Assembled Monolayer (SAM)

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