FEM Simulation of the Thermo-Mechanical Behavior of TSV 3D MEMS Structure

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Abstract:

As pitch of TSV shrinks down, mechanical characteristics of TSVs become more complicated and the heat of chip becomes a critical issue. The objective of this paper is to study thermal mechanical characteristics of ultra-fine pitch TSV. The thermal-mechanical characterization of an ultra-fine pitch chip is simulated with FEA.

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Periodical:

Key Engineering Materials (Volumes 562-565)

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108-113

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July 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] Koyanagi, M., T. Fukushima and T. Tanaka, High-density through silicon vias for 3-D LSIs. Proceedings of the IEEE, 2009. 97(1): p.49--59.

DOI: 10.1109/jproc.2008.2007463

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[2] Tu, K.N., Reliability challenges in 3D IC packaging technology. Microelectronics Reliability, 2010.

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