Characterization of Glass-Ceramics by TEM

Xiao Qing Liu; Jun Lin Xie; Feng He; Hu Yang

doi:10.4028/www.scientific.net/KEM.562-565.809

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 562-565Characterization of Glass-Ceramics by TEM

Characterization of Glass-Ceramics by TEM

Abstract:

The characterization technique of glass-ceramics by TEM was discussed by comparing the effects of single layer carbon film technique and double layers carbon film technique on the microstructure of Li-Al-Si glass-ceramics. The results show that double layers carbon film technique can improve glass-ceramics sample’s conductivity, reduce the induction of elctron beam on glass-ceramics, and avoid the temperature increasing of glass-ceramics particles caused by the charges aggregation on the particles’ surface when TEM electron beam hit down, prevent glass-ceramics from crystallization and the transformation of microstructurec. So, compared with single layer carbon film technique, double layers carbon film technique is more suitable for the research of microsture of glass-ceramics by TEM.

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Periodical:

Key Engineering Materials (Volumes 562-565)

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809-812

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.562-565.809

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Online since:

July 2013

Authors:

Xiao Qing Liu, Jun Lin Xie, Feng He, Hu Yang

Keywords:

Crystal Phase Transfer, Crystallization, Glass-Ceramics, TEM

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References

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