Improvement of the Stability of X-Ray Emission by Thermal Excitation of a Pyroelectric Single Crystal

Fumihiko Naruse; Hiroyuki Honda; Yoshikazu Nakanishi; Shinji Fukao; Yuuki Sato; Yoshiaki Ito; Shinzo Yoshikado

doi:10.4028/www.scientific.net/KEM.582.174

Paper Titles

Characterization of Cu₂O Thin Film Grown by Molecular Beam Epitaxy
p.157

Temperature Dependence of Resistivity of MoSi₂-Si Composite Thin Films
p.161

Preparation of BaZrO₃ Nanocrystals at Low Temperature
p.165

Preparation of Barium Titanate/Strontium Titanate Nanocube Accumulation Ceramics and their Dielectric Property
p.169

Improvement of the Stability of X-Ray Emission by Thermal Excitation of a Pyroelectric Single Crystal
p.174

Analysis of Grain-Boundary in SrCoO_3–Doped ZnO Varistors and its Electrical Characteristics
p.181

TEM Study for Self-Orientated LaNiO₃ Film along [100]
p.185

Oxygen Diffusion in Rare-Earth Doped BaTiO₃ Ceramics
p.189

UV-Visible Faraday Rotators Based on Rare-Earth Fluoride Single Crystals: LiREF₄ (RE=Tb, Dy, Ho, Er and Yb), PrF₃ and CeF₃
p.194

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Improvement of the Stability of X-Ray Emission by Thermal Excitation of a Pyroelectric Single Crystal

Abstract:

X-ray emission using pyroelectric crystals is intermittent, and has low intensity and stability. One of the factors for low stability is related to creeping discharge, due to the accumulation of surface electric charges that change in response to the temperature. The time dependence of the net amount of electric charge was investigated by changing the cycle period of the crystal temperature. The stability of the X-ray emission is demonstrated to be strongly dependent on the temperature cycle period.