Influence of Heat Treatment, Dopant and Impurity Content on Creep Parameters of Superplastic Zirconia
p.295
p.295
A Critical Re-Evaluation of the Abrasive Wear of Brittle Solids
p.301
p.301
Simulation of Ion Beam-Induced Collisional Processes in Thin Film Titanium Silicide
p.307
p.307
Materials Engineering Aspects of Magneto-Optic Recording Materials
p.313
p.313
Preparation and Characterisation of Insulating Homogeneous Thick Films
p.321
p.321
Finite Element Thermal Modelling of the Laser Soldering Process
p.329
p.329
Visible and Infrared Optical Reflectance Spectroscopy of Silicon on Insulator Substrates
p.337
p.337
Investigation of the Influence of Gas Pressure on Dry-Etched Induced Damage on Semi-Insulating GaAs Substrates
p.345
p.345
Incoming Inspection of Silicon-on-Insulator Substrates Using Spectroscopic and Single Wavelength Ellipsometry
p.353
p.353
Preparation and Characterisation of Insulating Homogeneous Thick Films
Abstract:
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Periodical:
Key Engineering Materials (Volumes 86-87)
Pages:
321-328
Citation:
Online since:
July 1993
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© 1993 Trans Tech Publications Ltd. All Rights Reserved
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