Fundamental Defects in GaAs: Present and Prospective in GaAs Microelectronics Technology

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Periodical:

Materials Science Forum (Volumes 10-12)

Edited by:

H.J. von Bardeleben

Pages:

1-8

DOI:

10.4028/www.scientific.net/MSF.10-12.1

Citation:

S. Miyazawa "Fundamental Defects in GaAs: Present and Prospective in GaAs Microelectronics Technology", Materials Science Forum, Vols. 10-12, pp. 1-8, 1986

Online since:

January 1986

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$35.00

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