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Enhanced Oxygen Diffusion in Silicon at Thermal Donor Formation Temperature
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Radiative Defects in Electron Irradiated InP
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Thermal Transformation of the Electron-Irradiation-Induced Defect H₄ in p Type InP
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Study of Electron Irradiation-Induced Defects in N-Type Active Layer of GaAs Mesfet
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Electron Microscope Observation of Highly Disordered Regions in Neutron Irradiated Germanium
p.1045

Climbing of Nearly Screw Dislocations in InSb Thin Foils Irradiated in a High Voltage Electron Microscope
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Comparison of Electron Paramagnetic Resonance and Transport Data during Thermal Recovery of Fast Neutron Irradiated GaAs
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Endor Study of Radiation Induced Defects in Semi-Insulating GaP
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Low Temperature Electron Irradiation Induced Defects in N-GaSb
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HomeMaterials Science ForumMaterials Science Forum Vols. 10-12Electron Microscope Observation of Highly...

Electron Microscope Observation of Highly Disordered Regions in Neutron Irradiated Germanium

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Defects in Semiconductors 14

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Periodical:

Materials Science Forum (Volumes 10-12)

Pages:

1045-1050

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.10-12.1045

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Online since:

January 1986

Authors:

Michio Kiritani, Mitsuji Hirata

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© 1986 Trans Tech Publications Ltd. All Rights Reserved

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