Paper Titles

Thermal Transformation of the Electron-Irradiation-Induced Defect H₄ in p Type InP
p.1033

Study of Electron Irradiation-Induced Defects in N-Type Active Layer of GaAs Mesfet
p.1039

Electron Microscope Observation of Highly Disordered Regions in Neutron Irradiated Germanium
p.1045

Climbing of Nearly Screw Dislocations in InSb Thin Foils Irradiated in a High Voltage Electron Microscope
p.1051

Comparison of Electron Paramagnetic Resonance and Transport Data during Thermal Recovery of Fast Neutron Irradiated GaAs
p.1057

Endor Study of Radiation Induced Defects in Semi-Insulating GaP
p.1063

Low Temperature Electron Irradiation Induced Defects in N-GaSb
p.1069

Electron Hopping between Bombardment Induced Defects in Gallium Arsenide
p.1075

Ga Antisite Defects in Neutron Irradiated and Annealed GaAs?
p.1081

HomeMaterials Science ForumMaterials Science Forum Vols. 10-12Comparison of Electron Paramagnetic Resonance and...

Comparison of Electron Paramagnetic Resonance and Transport Data during Thermal Recovery of Fast Neutron Irradiated GaAs

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Defects in Semiconductors 14

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Periodical:

Materials Science Forum (Volumes 10-12)

Pages:

1057-1062

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.10-12.1057

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Online since:

January 1986

Authors:

A. Goltzene, B. Meyer, C. Schwab

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© 1986 Trans Tech Publications Ltd. All Rights Reserved

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