High Resolution Transmission Electron Microscopy of Semiconductors and Their Defects

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Periodical:

Materials Science Forum (Volumes 10-12)

Edited by:

H.J. von Bardeleben

Pages:

735-744

Citation:

A. Ourmazd "High Resolution Transmission Electron Microscopy of Semiconductors and Their Defects", Materials Science Forum, Vols. 10-12, pp. 735-744, 1986

Online since:

January 1986

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$38.00

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