XRD Residual Stress and Texture Analysis on 6082T Aluminum Alloy

Article Preview

Abstract:

The determination of residual stresses is of great importance for many threated metal applications. In this work, the XRD residual stress analysis was used to characterized tempered aluminum-based specimen 6082T with rotation angles (phi) 0°, 45° and 90°, respectively. Highest stress levels were found in the rolling direction (phi = 0°), while negligible along transfers direction (phi = 90°). In addition, a shear stress along rolling and transverse direction, and also the present of texture along (110) can be observed.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volume 1028)

Pages:

409-414

Citation:

Online since:

April 2021

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2021 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] Y.L. Kang, Theory and technology of processing and forming for advanced automobile steel sheets, Metallurgical Industry Press, Beijing, 2009, p.230–232.

Google Scholar

[2] T. Senuma, Physical metallurgy of modern high strength steel sheets. ISIJ Int. 41 (2001) 520–532.

DOI: 10.2355/isijinternational.41.520

Google Scholar

[3] W.S. Miller, L. Zhuang, J. Bottema, A.J. Wittebrood, P. De Smet, A. Haszler, A. Vieregge, Recent development in aluminium alloys for the automotive industry, Mater. Sci. Eng. A 280 (2000) 37-49.

DOI: 10.1016/s0921-5093(99)00653-x

Google Scholar

[4] J. Hagstrom, R. Sandstrom, Mechanical properties of welded joints in thin walled aluminium extrusions, Sci. Technol. Weld. Join. 2. (1997) 199–208.

Google Scholar

[5] F.H. Froes, Advanced metals for aerospace and automotive use, Mater. Sci. Eng. A 184 (1994) 119–33.

Google Scholar

[6] P. J. Withers, H.K.D.H Bhadeshia, Residual Stress-II: Nature and Origins, Mat. Sci. Tech. 17 (2001) 366-375.

Google Scholar

[7] D.M. Finch, A review of non-destructive residual stress measurement techniques, ERA Report 94-0101R, ERA Technology Ltd, Leatherhead, Surrey, UK, (1994).

Google Scholar

[8] I.C. Noyan, T.C. Huang, B.R. York, Residual Stres/Strain Analysis in Thin Films by X-ray Diffraction, Critical Reviews in Solid State and Materials Sciences, 20 (1995) 125-177.

DOI: 10.1080/10408439508243733

Google Scholar

[9] F. Kandil, J. D. Lord, A. T. Fry, P. Grant, A review of residual stress measurement methods - a guide to technique selection, NPL Report MATC(A)O4, (2001).

Google Scholar

[10] M.E. Fitzpatrick, A.T. Fry, P. Holdway, F.A. Kandil, J. Shackleton, L. Suominen, Determination of Residual Stresses by X-ray Diffraction, NPL Guide No. 52, UK, (2005).

Google Scholar

[11] U. Reisgen, R. Sharma, S. Gach, S. Olschok, J. Francis, K. Bobzin, M. Oete, S. Wiesner, M. Knoch, A. Schmidt, Residual Stress Measurement in AlSi Alloys, Mat. Sci. Eng. Tech. 48 (2017) 1270-1275.

DOI: 10.1002/mawe.201700157

Google Scholar

[12] S. Khorsand, Y. Huang, Integrated Casting-Extrusion (ICE) of an AA6082 Aluminium Alloy, Light Metals, Light Metals 2017, The Minerals, Metals & Materials Series (2017) 235-241.

DOI: 10.1007/978-3-319-51541-0_32

Google Scholar

[13] D. Ogawa, T. Kakiuchi, K. Hashiba, Y. Uematsu, Residual stress measurement of Al/steel dissimilar friction stir weld, Science and Technology of Welding and Joining, 24 (2019) 1-10.

DOI: 10.1080/13621718.2019.1588521

Google Scholar

[14] H.J. Bunge, Texture Analysis in Materials Science: Mathematical Methods, Butterworths-Heinemann, London, (1982).

Google Scholar

[15] N.C. Popa, Texture in Rietveld refinement, J. Appl. Crystallogr. 25 (1992) 611-616.

DOI: 10.1107/s0021889892004795

Google Scholar

[16] R.B. Von Dreele, Quantitative texture analysis by Rietveld refinement, J. Appl. Crystallogr. 30 (1997) 517-525.

DOI: 10.1107/s0021889897005918

Google Scholar

[17] Bruker AXS, Diffrac C Plus Leptos 7, DOC-M88-EXX052 V7, Germany, (2009).

Google Scholar

[18] L. Lutterotti, Total pattern fitting for the combined size-strain-stress-texture determination in thin film diffraction, Nuclear Inst. and Methods in Physics Research B 268 (2010) 334-340.

DOI: 10.1016/j.nimb.2009.09.053

Google Scholar

[19] L. Lutterotti, M. Bortolotti, G. Ischia, I. Lonardelli, H.R. Wenk, Rietveld texture analysis from diffraction images, Z. Kristallogr., Suppl. 26 (2007) 125-130.

DOI: 10.1524/zksu.2007.2007.suppl_26.125

Google Scholar

[20] L. Lutterotti, D. Chateigner, S. Ferrari, J. Ricote, Texture, residual stress and structural analysis of thin films using a combined x-ray analysis, Thin Solid Films 450 (2004) 34-41.

DOI: 10.1016/j.tsf.2003.10.150

Google Scholar