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HomeMaterials Science ForumMaterials Science Forum Vols. 117-118Identification of Residual Donors in CdTe Grown by...

Identification of Residual Donors in CdTe Grown by the Bridgman Method

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Shallow Impurities in Semiconductors V

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Periodical:

Materials Science Forum (Volumes 117-118)

Pages:

471-476

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.117-118.471

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Online since:

January 1993

Authors:

S. Seto, A. Tanaka

Keywords:

Bound Exciton, Donors, Impurity, Photoluminescence (PL)

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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