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The Configurational Change of a Metastable S-Cu Defect in Silicon
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Metastable-Defect Behaviors of Iron-Boron Pairs in Silicon
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The Configurational Change of a Metastable S-Cu Defect in Silicon

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Defects in Semiconductors 17 View Preview

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1179-1184

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1179

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Online since:

October 1993

Authors:

W.M. Chen, Erik Janzén, Bo Monemar, Anne Henry, A.M. Frens, M.T. Bennebroek, J. Schmidt

Keywords:

Excitonic Auger, Free Excitons, Metastability, Transfer Mechanism

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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