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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Electrical Characterization of Surface Defects on...

Electrical Characterization of Surface Defects on Porous p-Type Silicon

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Defects in Semiconductors 17

Info:

Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1475-1480

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1475

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Online since:

October 1993

Authors:

C. Cadet, D. Deresmes, D. Vuillaume, Didier Stiévenard, A. Grosman, C. Ortega, J. Siejka, Hans Jürgen von Bardeleben

Keywords:

Electrical Characterization, Porous Silicon (PS), Surface Defect

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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