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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Optically Detected Magnetic Resonance...

Optically Detected Magnetic Resonance Investigations on Rapidly Thermally Oxidized Porous Silicon

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1459-1462

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1459

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Online since:

October 1993

Authors:

D.M. Hofmann, B.K. Meyer, W. Stadler, A. Kux, V. Petrova-Koch, F. Koch

Keywords:

Defect, Porous Silicon (PS), Spin Resonance

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Сopyright:

© 1994 Trans Tech Publications Ltd. All Rights Reserved

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