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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Impurity Self-Screening

Impurity Self-Screening

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1445-1450

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1445

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Online since:

October 1993

Authors:

Zbysław Wilamowski, Hanka Przybylinska

Keywords:

Charge Correlation, Impurity Self-Screening, Potential Fluctuations

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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