On the Sensitivity of Optical Reflectivity Spectra to the Bulk Defects in Semiconductors - Example of Crystalline Si

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Periodical:

Materials Science Forum (Volumes 143-147)

Edited by:

Helmut Heinrich and Wolfgang Jantsch

Pages:

183-188

DOI:

10.4028/www.scientific.net/MSF.143-147.183

Citation:

R. Iwanowski et al., "On the Sensitivity of Optical Reflectivity Spectra to the Bulk Defects in Semiconductors - Example of Crystalline Si", Materials Science Forum, Vols. 143-147, pp. 183-188, 1994

Online since:

October 1993

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