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HomeMaterials Science ForumMaterials Science Forum Vols. 173-174Recombination Lifetime in Silicon from Laser...

Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement

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Periodical:

Materials Science Forum (Volumes 173-174)

Pages:

255-258

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174.255

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Online since:

September 1994

Authors:

C.H. Ling, H.K. Teoh, W.K. Choi, T.Q. Zhou, L.K. Ah

Keywords:

Corona-Charged Silicon Oxide, Laser Photoconductance, Microwave Photoconductance, Recombination Lifetime in Silicon

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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