Paper Titles

Raman and Nonlinear Light Scattering from Undersurface Layers of Ion Implanted Silicon Crystals
p.237

Raman Study of "Boson Peak" in Amorphous Silicon: Dependence on Hydrogen and Carbon Content
p.243

Structural Investigation of Microcrystalline Silicon
p.249

Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement
p.255

Investigation of Electronic Transport in Semiconductor Junctions by Photoinduced Laser Beam Deflection
p.259

Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers
p.265

Diagnostics of Semiconductor Surface by Laser-Induced Photovoltage
p.273

Characterization of the M. O. S. Structure by the Surface Photoelectrical Voltage Method
p.279

Optical Second-Harmonic Generation (SHG) on Semiconductor Electrodes by Means of Femtosecond and Nanosecond-Pulse Lasers
p.285

HomeMaterials Science ForumMaterials Science Forum Vols. 173-174Investigation of Electronic Transport in...

Investigation of Electronic Transport in Semiconductor Junctions by Photoinduced Laser Beam Deflection

Article Preview

Abstract:

You might also be interested in these eBooks

Semiconductor Processing and Characterization with Lasers

Info:

Periodical:

Materials Science Forum (Volumes 173-174)

Pages:

259-264

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174.259

Citation:

Cite this paper

Online since:

September 1994

Authors:

P. Grunow, R. Schieck, M. Kunst

Keywords:

PDS, Photovoltaic (PV)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1995 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: