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Investigation of Electronic Transport in Semiconductor Junctions by Photoinduced Laser Beam Deflection
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Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers
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Characterization of the M. O. S. Structure by the Surface Photoelectrical Voltage Method
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HomeMaterials Science ForumMaterials Science Forum Vols. 173-174Nondestructive and Contactless Evaluation of...

Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers

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Periodical:

Materials Science Forum (Volumes 173-174)

Pages:

265-272

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174.265

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Online since:

September 1994

Authors:

Hans D. Geiler

Keywords:

Non-Destructive Evaluation (NDE), Photothermal Analysis, Semiconductor, Surface Recombination Velocity

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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