Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 173-174)

Edited by:

M. Briege, H. Dittrich, M. Klose, H.W. Schock, J. Werner

Pages:

265-272

Citation:

H. D. Geiler "Nondestructive and Contactless Evaluation of Electrical and Thermal Properties of Thin Semiconducting Layers", Materials Science Forum, Vols. 173-174, pp. 265-272, 1995

Online since:

September 1994

Authors:

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.