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HomeMaterials Science ForumMaterials Science Forum Vols. 185-188EXAFS Analysis of Passivating Films

EXAFS Analysis of Passivating Films

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Abstract:

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Passivation of Metals and Semiconductors

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Periodical:

Materials Science Forum (Volumes 185-188)

Pages:

301-312

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.185-188.301

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Online since:

March 1995

Authors:

H.-H. Strehblow, P. Borthen

Keywords:

EXAFS, Grazing Incidence, Passive Layer, X-Ray Reflectivity

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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