Methods to Determine the Composition of Passive Films: Recent Trends in XPS, AES and SIMS

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Periodical:

Materials Science Forum (Volumes 185-188)

Edited by:

K.E. Heusler

Pages:

313-324

DOI:

10.4028/www.scientific.net/MSF.185-188.313

Citation:

D. Landolt et al., "Methods to Determine the Composition of Passive Films: Recent Trends in XPS, AES and SIMS", Materials Science Forum, Vols. 185-188, pp. 313-324, 1995

Online since:

March 1995

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$35.00

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