Structure Inhomogeneities of the Oxide Dielectric and the Properties of Tantalum Capacitors

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Periodical:

Materials Science Forum (Volumes 185-188)

Edited by:

K.E. Heusler

Pages:

573-580

DOI:

10.4028/www.scientific.net/MSF.185-188.573

Citation:

S.D. Khanin "Structure Inhomogeneities of the Oxide Dielectric and the Properties of Tantalum Capacitors", Materials Science Forum, Vols. 185-188, pp. 573-580, 1995

Online since:

March 1995

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