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HomeMaterials Science ForumMaterials Science Forum Vols. 185-188Structure Inhomogeneities of the Oxide Dielectric...

Structure Inhomogeneities of the Oxide Dielectric and the Properties of Tantalum Capacitors

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Periodical:

Materials Science Forum (Volumes 185-188)

Pages:

573-580

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.185-188.573

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Online since:

March 1995

Authors:

S.D. Khanin

Keywords:

Conductivity, Dielectric Spectroscopy, Excess Noise, Injection Current, Loss Tangent, Structural Defects

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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