Transient Ionic Space Charges in Thin Oxide Films: Determination of Thickness Distribution, Temperature, and Localized Phenomena

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Periodical:

Materials Science Forum (Volumes 185-188)

Edited by:

K.E. Heusler

Pages:

611-620

DOI:

10.4028/www.scientific.net/MSF.185-188.611

Citation:

M.M. Lohrengel and S. Rüsse, "Transient Ionic Space Charges in Thin Oxide Films: Determination of Thickness Distribution, Temperature, and Localized Phenomena", Materials Science Forum, Vols. 185-188, pp. 611-620, 1995

Online since:

March 1995

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$35.00

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