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HomeMaterials Science ForumMaterials Science Forum Vols. 185-188Logarithmic Kinetics of the Ion Charge...

Logarithmic Kinetics of the Ion Charge Accumulation in the SiO₂ Dielectric Layers

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Periodical:

Materials Science Forum (Volumes 185-188)

Pages:

591-600

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.185-188.591

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Online since:

March 1995

Authors:

V.N. Ovsyuk

Keywords:

Ionic Transport, MIS Structure, Silicon Dioxide Layers

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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