A New eletrochemical Technique for In Situ Measurement of Electric Resistance and Semiconductor Characteristics of Surface Films on Metals

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Periodical:

Materials Science Forum (Volumes 185-188)

Edited by:

K.E. Heusler

Pages:

621-630

DOI:

10.4028/www.scientific.net/MSF.185-188.621

Citation:

T. Saario and J. Piippo, "A New eletrochemical Technique for In Situ Measurement of Electric Resistance and Semiconductor Characteristics of Surface Films on Metals", Materials Science Forum, Vols. 185-188, pp. 621-630, 1995

Online since:

March 1995

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