Study of Electron Irradiation-Induced Defects of 3c-SiC and Diamond by Ultra-High Voltage Electron Microscopy

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Periodical:

Materials Science Forum (Volumes 196-201)

Edited by:

M. Suezawa and H. Katayama-Yoshida

Pages:

1237-1242

DOI:

10.4028/www.scientific.net/MSF.196-201.1237

Citation:

R. Oshima et al., "Study of Electron Irradiation-Induced Defects of 3c-SiC and Diamond by Ultra-High Voltage Electron Microscopy", Materials Science Forum, Vols. 196-201, pp. 1237-1242, 1995

Online since:

November 1995

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