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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201High Resolution DLTS Studies of...

High Resolution DLTS Studies of Transition-Metal-Related Defects in Silicon

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

669-676

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.669

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Online since:

November 1995

Authors:

L. Dobaczewski, P. Kamiński, R. Kozłowski, M. Surma

Keywords:

Defect Complexes, Laplace DLTS, Silicon, Thermal Donor, Transition Metal

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Сopyright:

© 1995 Trans Tech Publications Ltd. All Rights Reserved

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