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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Zeeman Spectroscopy and Crystal-Field Model of...

Zeeman Spectroscopy and Crystal-Field Model of Neutral Vandium in 6H-Silicon Carbide

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

707-712

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.707

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Online since:

November 1995

Authors:

B. Kaufmann, Achim Dörnen, Frank S. Ham

Keywords:

PL, Silicon Carbide (SiC), V⁴⁺, Zeeman Effect

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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