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HomeMaterials Science ForumMaterials Science Forum Vols. 228-231On the Thickness-Dependence of Textures in...

On the Thickness-Dependence of Textures in Electrodeposited Copper-Coatings

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Periodical:

Materials Science Forum (Volumes 228-231)

Pages:

463-468

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.228-231.463

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Online since:

July 1996

Authors:

I. Handreg, P. Klimanek, G. Lanza, M. Schneider

Keywords:

Atomic Force Microscope (AFM), Cu-Coatings, Electro-Deposition, Epitaxy, Microstructure, Nucleation, Texture, X-Ray Diffraction (XRD)

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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