In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 248-249)

Edited by:

A.G. Balogh and G. Walter

Pages:

129-134

DOI:

10.4028/www.scientific.net/MSF.248-249.129

Citation:

L.P. Biró et al., "In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope", Materials Science Forum, Vols. 248-249, pp. 129-134, 1997

Online since:

May 1997

Export:

Price:

$35.00

In order to see related information, you need to Login.