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HomeMaterials Science ForumMaterials Science Forum Vols. 248-249In-Depth Characterization of Damage Produced by...

In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope

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Materials Science Applications of Ion Beam Techniques

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Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

129-134

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.129

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Online since:

May 1997

Authors:

L.P. Biró, J. Gyulai, K. Havancsák

Keywords:

Atomic Force Microscope (AFM), Cleavage, HOPG, In-Depth Damage Characterization, Mica, Parallel Irradiation, Silicon, Swift Heavy Ions, Tapping Mode

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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