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HomeMaterials Science ForumMaterials Science Forum Vols. 248-249Characterization of Cu/Al2O3 Interfaces after...

Characterization of Cu/Al₂O₃ Interfaces after Heavy Ion Irradiation

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Materials Science Applications of Ion Beam Techniques

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Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

125-128

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.125

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Online since:

May 1997

Authors:

K. Neubeck, M. Rodewald, R. Riemenschneider, D.M. Rück, H. Baumann, Horst Hahn, Adam G. Balogh

Keywords:

Ceramic Interfaces, Diffusion, Electron Microscopy, Interface Roughness, Ion Beam Mixing, Metal Interfaces, Rutherford Backscattering Spectroscopy, Sputtering

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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