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HomeMaterials Science ForumMaterials Science Forum Vols. 248-249Ion Beam and Electrical Conductivity Analysis of...

Ion Beam and Electrical Conductivity Analysis of Nanocrystalline α-BN and α-Al₂O₃ Ceramics Implanted with Ti⁺ⁿ Ions and Annealed

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Materials Science Applications of Ion Beam Techniques

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Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

271-278

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.271

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Online since:

May 1997

Authors:

S.M. Duvanov, A.V. Kabyshev, A.P. Kobzev

Keywords:

Ceramic, Electrical Conductivity Analysis, Ion Beam Analysis, Pulsed Ion Implantation, Thermal Annealing

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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