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HomeMaterials Science ForumMaterials Science Forum Vols. 248-249Corrosion Depth Profiles by Rutherford...

Corrosion Depth Profiles by Rutherford Backscattering Spectrometry and Synchrotron X-Ray Reflrectometry

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Materials Science Applications of Ion Beam Techniques

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Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

365-368

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.365

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Online since:

May 1997

Authors:

E. Szilágyi, L. Bottyán, L. Deák, E. Gerdau, V.N. Gittsovich, A. Gróf, E. Kótai, O. Leupold, D.L. Nagy, V.G. Semenov

Keywords:

Corrosion, Depth-Profiling, Rutherford Backscattering, Synchrotron Radiation (XRD), Thin Film, X-Ray Reflectometry

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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