Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry

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Periodical:

Materials Science Forum (Volumes 248-249)

Edited by:

A.G. Balogh and G. Walter

Pages:

373-376

DOI:

10.4028/www.scientific.net/MSF.248-249.373

Citation:

E. Szilágyi et al., "Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry", Materials Science Forum, Vols. 248-249, pp. 373-376, 1997

Online since:

May 1997

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$35.00

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