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HomeMaterials Science ForumMaterials Science Forum Vols. 248-249Thin-Film Morphology and Rutherford Backscattering...

Thin-Film Morphology and Rutherford Backscattering Spectrometry

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Materials Science Applications of Ion Beam Techniques

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Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

409-412

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.409

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Online since:

May 1997

Authors:

Th. Hahn, H. Metzner, M. Gossla, J. Conrad

Keywords:

Rutherford Backscattering, Scanning Tunneling Microscopy, Surface Morphology

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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