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HomeMaterials Science ForumMaterials Science Forum Vols. 248-249Electronic Sputtering and Desorption Effects in...

Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au⁶⁹⁺

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Materials Science Applications of Ion Beam Techniques

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Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

413-418

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.413

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Online since:

May 1997

Authors:

T. Schenkel, M.A. Briere, H. Schmidt-Böcking, Klaus Bethge, D. Schneider

Keywords:

Electronic Sputtering, Graphite, Highly Charged Ions, SiO₂, Time of Flight-SIMS

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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